Platinum nanocrystals supported by silica, alumina and ceria: Metal-support interaction due to high-temperature reduction in hydrogen

Surface Science

Volumn 532-535, Issue , 2003, Pages 276-280

  Penner, S ^a   Wang, D ^b   Su, D S ^b   Rupprechter, G ^b   Podloucky, R ^c   Schlogl R ^b   Hayek, K ^a  

^a UNIVERSITY OF INNSBRUCK   (Austria)

^b FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

^c UNIVERSITY OF VIENNA   (Austria)

Author keywords

Alloys; Catalysis; Electron microscopy; Platinum; Surface relaxation and reconstruction

Indexed keywords

ALUMINA; CATALYSIS; CRYSTALLOGRAPHY; ELECTRON ENERGY LOSS SPECTROSCOPY; HIGH TEMPERATURE EFFECTS; HYDROGEN; PLATINUM; SILICA; SODIUM CHLORIDE; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

NANOCRYSTALS;

NANOSTRUCTURED MATERIALS;

EID: 17344376602     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00198-5     Document Type: Conference Paper

References (16)

1. Rupprechter G., Hayek K., Rendon L., José-Yacaman M. Thin Solid Films. 260:1995;148.
2. Hayek K., Fuchs M., Klötzer B., Reichl W., Rupprechter G. Top. Catal. 13:2000;55.
3. Haller G.L., Resasco D.E. Adv. Catal. 36:1989;173.
4. den Otter G.J., Dautzenberg F.M. J. Catal. 53:1978;116.
5. Lamber R., Jaeger N. J. Appl. Phys. 70:1991;457.
6. Powder Diffraction File 1994, PDF 2 Database 1-44, International Center for Diffraction Data.
7. D. Wang, S. Penner, G. Rupprechter, D.S. Su, K. Hayek, R. Schlögl, Mat. Chem. Phys., in press.
8. Bronger W., Müller P., Wrzesien K., Anorg Z. Allg. Chem. 623:1997;362.
9. Bernal S., Calvino J.J., Cauqui M.A., Gatica J.M., Larese C., Pérez-Omil J.A., Pintado J.M. Catal. Today. 50:1999;175.
10. S. Penner D. Wang, D.S. Su, G. Rupprechter, R. Schlögl, K. Hayek, Vacuum, in press.
11. Wang T., Lee C., Schmidt L.D. Surf. Sci. 163:1985;181.
12. Romanowski W., Lamber R. Thin Solid Films. 127:1985;139.
13. Shi A.-C., Masel R.I. J. Catal. 120:1989;421.
14. Landolt-Börnstein New Series IV/5a, IV/5c and IV/5I.
15. Kresse G., Hafner J. Phys. Rev. B. 47:1993;RC558.
16. Ramachandran A.S., Anderson S.L., Datye A.K. Ultramicroscopy. 51:1993;282.