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Volumn 57, Issue 5, 1998, Pages 3546-3553

Enhancement of dielectronic processes in [Formula Presented] collisions at low keV energies

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EID: 17344368469     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.57.3546     Document Type: Article
Times cited : (19)

References (43)
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    • N. Stolterfoht, Progress in Atomic Spectroscopy, Part D, edited by H. J. Beyer and H. Kleinpoppen (Plenum, New York, 1987), p. 415
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    • A mistake occurred in Ref
    • A mistake occurred in Ref. 19: In Table II, the value of 6.28 attributed to the cross section (Formula presented) for Auger emission from the mixed components (Formula presented) (Formula presented) and (Formula presented) (labeled “(Formula presented)”) should be replaced by 3.61.
  • 38
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    • Although the discrepancies between the calculated and experimental Auger yields are small, note that the differences between the corresponding fluorescence yields can be significant when the Auger yields are close to 1. Such discrepancies for the fluorescence yields are important when regarding the radiative stabilization of the doubly-excited states produced in atomic collisions
    • Although the discrepancies between the calculated and experimental Auger yields are small, note that the differences between the corresponding fluorescence yields can be significant when the Auger yields are close to 1. Such discrepancies for the fluorescence yields are important when regarding the radiative stabilization of the doubly-excited states produced in atomic collisions.
  • 41
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    • J.-Y. Chesnel, Ph.D. thesis, University of Caen, France, 1996
    • J.-Y. Chesnel, Ph.D. thesis, University of Caen, France, 1996.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.