An application of TOF-SIMS to the investigation of a Co/Al 2O3 catalyst

Reaction Kinetics and Catalysis Letters

Volumn 84, Issue 2, 2005, Pages 237-245

  Paryjczak, Tadeusz ^a  

^a LODZ UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Aluminium oxide; Catalysis; Cobalt; TOF SIMS

Indexed keywords

ALUMINUM COMPOUNDS; COBALT; SECONDARY ION MASS SPECTROMETRY; SURFACE REACTIONS; SURFACE STRUCTURE; SYNTHESIS (CHEMICAL); TEMPERATURE PROGRAMMED DESORPTION;

ALUMINUM OXIDE; SURFACE AREA; SURFACE IMAGES; TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF-SIMS);

CATALYSTS;

EID: 17344363977     PISSN: 01331736     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11144-005-0215-4     Document Type: Article

References (34)

1. C.J. Bertole, C.A. Mims, G. Kiss: J. Catal., 221, 191 (2004).
2. G. Jacobs, P.M. Patterson, Y. Zhang, T. Das, J. Li, B.H. Davis: Appl. Catal. A, 233, 215 (2002).
3. J. Li, X. Zhan, Y. Zhang, G. Jacobs, T. Das, B.H. Davis: Appl. Catal. A, 228, 203 (2002).
4. M.E. Dry: Catal. Today, 71, 227 (2002).
5. J. Yan, M.C. Rung, W.M.H. Sachtler, H.H. Kung: J. Catal., 172, 178 (1997).
6. N. Nagaraju, A. Fonseca, Z. Konya, J.B. Nagy: J. Mol. Catal. A, 181, 57 (2002).
7. F. Haga, T. Nakajima, K. Yamashita, S. Mishima: React. Kinet. Catal. Lett., 63(2), 253 (1998).
8. E. Furimsky, F.E. Massoth: Catal. Today, 52, 381 (1999).
9. R. Oukaci, A.H. Singleton, J.G. Goodwin Jr.: Appl. Catal. A, 186, 129 (1999).
10. J. Zhang, J. Chen, J. Ren, Y. Sun: Appl. Catal. A, 243, 121 (2003).
11. G. Jacobs, T.K. Das, P.M. Patterson, J. Li, L. Sanchez, B.H. Davis: Appl. Catal. A, 247, 335 (2003).
12. G. Jacobs, T.K. Das, Y. Zhang, J. Li, G. Racoillet, B.H. Davis: Appl. Catal. A, 233, 263 (2002).
13. A.M. Hilmen, D. Schanke, K.P. Hanssen, A. Holmen: Appl. Catal. A, 186, 169 (1999).
14. E. Finocchio, T. Montanari, C. Resini, G. Busca: J. Mol. Catal. A, 204-205, 535 (2003).
15. S. Todorova, V. Zhelyazkov, G. Kadinov: React. Kinet. Catal. Lett., 57, 105 (1996).
16. B. Jongsomjit, J. Panpranot, J.G. Goodwin Jr.: J. Catal., 215, 66 (2003).
17. B. Jongsomjit, J.G. Goodwin Jr.: Catal. Today, 77, 191 (2002).
18. M. Voss, D. Borgmann, G. Wedler: J. Catal., 212, 10 (2002).
19. L.F. Liotta, G. Pantaleo, A. Macalusco, G. Di Carlo, G. Deganello: Appl. Catal. A, 245, 167 (2003).
20. M.W.J. Craje, A.M. van der Kraan, J. van de Loosdrecht, P.J. van Berge: Catal. Today, 71, 369 (2002).
21. A. Benninghoven: Angew. Chem. Int. Ed. Engl., 33, 1023 (1994).
22. J.C. Vickerman and D. Briggs, (Ed.): TOF-SIMS Surface Analysis by Mass. IM Publications and Surface Spectra Limited, Chichester, 2001.
23. T. Paryjczak, M.I. Szynkowska: Przem. Chem., 82, 199 (2003).
24. G. Lalande, R. Cote, G. Tamizhmani, D. Guay, J.P. Dodelet, L. Dignard-Bailey, L.T. Weng, P. Bertrand: Electrochim. Acta, 40, 2635 (1995).
25. G. Faubert, G. Lalande, R. Cote, D. Guay, J.P. Dodelet, L.T. Weng, P. Bertrand, G. Denes: Electrochim. Acta, 41, 1689 (1996).
26. P. Gouerec, A. Biloul, O. Contamin, G. Scarbeck, M. Savy, J. Riga, L.T. Weng, P. Bertrand: J. Electroanal. Chem., 422, 61 (1997).
27. G. Kowalski, J. Pielichowski, M. Jasieniak: Appl. Catal. A, 247, 295 (2003).
28. J. Grams, J. Góralski, I. Ludomirska, T. Paryjczak: Przem. Chem., 80, 503 (2001).
29. J. Grams, J. Góralski, T. Paryjczak: Surf. Sci., 549, L21 (2004).
30. P. Arnoldy, J.A. Moulijn: J. Catal., 93, 38 (1985).
31. J. Rynkowski, T. Paryjczak: Przem. Chem., 67, 504 (1988).
32. B. Hagenhoff: Mikrochim. Acta, 132, 259 (2000).
33. L.T. Weng, P. Bertrand, O. Tirions, M. Devillers: Appl. Surf. Sci., 99, 185 (1996).
34. Y.L. Leung, B.J. Flinn, P.C. Wong, K.A.R. Mitchell, K.J. Smith: Appl. Surf. Sci., 125, 293 (1998).