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Volumn 364-1, Issue , 1999, Pages 317-322
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Drag reduction on microscale concave-convex surface
a a b b c c |
Author keywords
[No Author keywords available]
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Indexed keywords
CONTACT ANGLE;
PHASE INTERFACES;
REACTIVE ION ETCHING;
REYNOLDS NUMBER;
SILICON WAFERS;
VELOCITY MEASUREMENT;
WALL FLOW;
DRAG REDUCTION;
FLOW RESISTANCE;
HYDROPHOBIC COATING;
ULTRA SMALL SCALE CONCAVE CONVEX SURFACE;
DRAG;
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EID: 17144474110
PISSN: 02725673
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (8)
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References (7)
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