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Volumn , Issue , 2000, Pages
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International electron devices meeting 2000
[No Author Info available]
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARGE CARRIERS;
CMOS INTEGRATED CIRCUITS;
COMPUTATIONAL METHODS;
DIELECTRIC MATERIALS;
EPITAXIAL GROWTH;
IMPACT IONIZATION;
INCANDESCENT LAMPS;
LIGHT EMITTING DIODES;
POWER INTEGRATED CIRCUITS;
RAPID THERMAL ANNEALING;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR DOPING;
SWITCHING CIRCUITS;
THIN FILM TRANSISTORS;
ZIRCONIUM COMPOUNDS;
EIREV;
GATE DIELECTRICS;
MICROSYSTEMS;
POLYSILICON GATE ELECTRODES;
RAPID THERMAL CHEMICAL VAPOR DEPOSITION (RTCVD);
SAFE OPERATING AREA (SOA);
SOLID STATE LIGHTING;
MOSFET DEVICES;
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EID: 17144473415
PISSN: 01631918
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Review |
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Times cited : (1)
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References (0)
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