Fine art painting characterization by spectroscopic ellipsometry: Preliminary measurements on varnish layers

Thin Solid Films

Volumn 455-456, Issue , 2004, Pages 207-212

  Christofides, C ^a   Castellon, B ^b   Othonos, A ^a   Polikreti, K ^a   De Deyne, C ^c  

^a UNIVERSITY OF CYPRUS   (Cyprus)

^b SOPRA   (France)

^c Laboratoire de Recherche   (France)

Author keywords

Non destructive characterization; Paint; Resin; Spectroscopic ellipsometry; Varnish

Indexed keywords

ELLIPSOMETRY; IMAGE PROCESSING; NONDESTRUCTIVE EXAMINATION; PAINT; RESINS; SPECTROSCOPIC ANALYSIS; VARNISH;

FINE ARTS; PAINTING CHARACTERIZATION; SPECTROSCOPIC ELLIPSOMETRY; SUPERFICIAL LAYERS;

PAINTING;

EID: 17144463885     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.02.033     Document Type: Conference Paper

References (6)

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2. G.A. Van der Doelen, Molecular studies of fresh and aged triterpenoid varnishes, Ph.D. Thesis, Universiteit van Amsterdam, 1999.
3. De la Rie, René E. Old master paintings: photochemical and thermal degradation of films of dammar resin. Stud. Conserv. 33:1988;53-70.
4. J. Van der Weerd, Microspectroscopic analysis of traditional oil paint, Ph D Thesis, AMOLF, 2002.
5. L. Simonot, Etude expérimentale et modélisation de la diffusion de la lumière dans une couche de peinture colorée et translucide - Application à l'effet visuel des glacis et des vernis, Thèse de Doctorat, Université Pierre et Marie Curie, 2002, 103-106.
6. Conservation Restoration Innovation Systems for Image Capture and Digital Archiving to enhance Training Education and Lifelong Learning (IST - 1999 - 20163 R&D program).