Electrical properties of nanosized non-barrier inhomogeneities in Zn-based metal-semiconductor contacts to InP

Applied Surface Science

Volumn 123-124, Issue , 1998, Pages 567-570

  Clausen, Thomas ^a   Leistiko, Otto ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Nanophases; Ohmic contacts; Schottky contacts

Indexed keywords

CHARGE CARRIERS; ELECTRIC RESISTANCE; METALLIZING; NANOSTRUCTURED MATERIALS; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTOR METAL BOUNDARIES; ZINC ALLOYS;

SCHOTTKY CONTACTS;

OHMIC CONTACTS;

EID: 17144449938     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)00572-2     Document Type: Article

References (4)

1. R.T. Tung, Phys. Rev. B 45 (1992) 13509.
2. T. Clausen et al., Appl. Phys. Lett. 62 (10) (1993) 1108.
3. T. Clausen et al., Thin Solid Films 232 (1993) 215.
4. I. Ohdomari, K.N. Tu, J. Appl. Phys. 51 (1980) 3735.