Analysis of the structure of lead borosilicate glasses using laser ionization time of flight mass spectroscopy

Journal of Non-Crystalline Solids

Volumn 293-295, Issue 1, 2001, Pages 416-421

  Stentz, D ^a   Blair, S ^a   Goater, C ^a   Feller, S ^a   Affatigato, M ^a  

^a Department of Business Administration and Economics   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IONIZATION; LASER BEAM EFFECTS; MASS SPECTROMETRY; POSITIVE IONS; SEMICONDUCTING LEAD COMPOUNDS; SEMICONDUCTOR DOPING; SEMICONDUCTOR GROWTH;

LASER IONIZATION TIME-OF-FLIGHT MASS SPECTROSCOPY (LITOF-MS);

BOROSILICATE GLASS;

EID: 17144449248     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(01)00837-7     Document Type: Conference Paper

References (11)