Breakdown strength of two-layer dielectrics

IEE Conference Publication

Volumn 4, Issue 467, 1999, Pages

  Lebedev, S M ^a   Gefle, O S ^a   Pokholkov, Yu P ^a   Chichikin, V I ^a  

^a NATIONAL RESEARCH TOMSK POLYTECHNIC UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC BREAKDOWN; ELECTRIC CONDUCTIVITY; ELECTRIC FIELD EFFECTS; ELECTRIC LOSSES; PERMITTIVITY; POLARIZATION;

BREAKDOWN STRENGTH;

ELECTRIC INSULATING MATERIALS;

EID: 17144435353     PISSN: 05379989     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)