Microstructure characterization of ZnFe2-xMxO 4 (M = Bi, Y and x = 0.1, 0.2) ferrites by the rietveld refinement

Turkish Journal of Physics

Volumn 29, Issue 2, 2005, Pages 85-90

  Al Haj, Mansour ^a  

^a MUTAH UNIVERSITY   (Jordan)

Author keywords

Ferrites; Lattice parameter; Magnetization; Paramagnetic; X ray diffraction

Indexed keywords

BISMUTH; DIFFRACTOMETERS; FERRITES; LATTICE CONSTANTS; MAGNETIZATION; PARAMAGNETISM; X RAY DIFFRACTION; YTTRIUM; ZINC COMPOUNDS;

DEBYE-WALLER FACTORS; PROFILE BROADENING; RIETVELD REFINEMENT; SPINEL PHASE;

MICROSTRUCTURE;

EID: 17144426951     PISSN: 13000101     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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