Fifty years of x-ray photoelectron spectroscopy

Journal of Analytical Chemistry

Volumn 60, Issue 3, 2005, Pages 297-300

  Alov, N V ^a  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; CRYSTAL LATTICES; DIELECTRIC MATERIALS; INTERFACES (MATERIALS); IRRADIATION; MULTILAYERS; PHOTOELECTRICITY; SURFACE CHEMISTRY; THIN FILMS;

ENERGY SPECTRUM; SPATIAL CHARGE DISTRIBUTION; SURFACE ATOMS; SURFACE FORMATIONS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 17144402217     PISSN: 10619348     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10809-005-0087-9     Document Type: Review

References (24)

1. Siegbahn, K., Nordling, C., and Fahlman, A., et al., ESCA: Atomic, Molecular, and Solid State Structure Studied by Means of Electron Spectroscopy, Uppsala: Almqvist and Wiksells, 1967. Translated under the title Elektronnaya spektroskopiya, Moscow: Mir, 1971.
2. Siegbahn, K., Nordling, C., and Fahlman, A., et al., ESCA: Atomic, Molecular, and Solid State Structure Studied by Means of Electron Spectroscopy, Uppsala: Almqvist and Wiksells, 1967. Translated under the title Elektronnaya spektroskopiya, Moscow: Mir, 1971.
3. Siegbahn, K., Electron Spectroscopy for Atoms, Molecules, and Condensed Matter: Nobel Lecture, December 18, 1981, The Nobel Foundation, 1982. Translated under the title Elektronnaya spektroskopiya atomov, molekul i kondensirovannogo veshchestva, Usp. Fiz. Nauk, 1982, vol. 138, no. 2, p. 223.
4. Siegbahn, K., Electron Spectroscopy for Atoms, Molecules, and Condensed Matter: Nobel Lecture, December 18, 1981, The Nobel Foundation, 1982. Translated under the title Elektronnaya spektroskopiya atomov, molekul i kondensirovannogo veshchestva, Usp. Fiz. Nauk, 1982, vol. 138, no. 2, p. 223.
5. Baker, A. and Betteridge, D., Photoelectron Spectroscopy, Oxford: Pergamon, 1972. Translated under the tide Fotoelektronnaya spektroskopiya, Moscow: Mir, 1975.
6. Baker, A. and Betteridge, D., Photoelectron Spectroscopy, Oxford: Pergamon, 1972. Translated under the tide Fotoelektronnaya spektroskopiya, Moscow: Mir, 1975.
7. Riggs, V. and Parker, M., in Methods of Surface Analysis, Czanderna, A., Ed., Amsterdam: Elsevier, 1975. Translated under the title Melody analiza poverkhnosti, Moscow: Mir, 1979, p. 137.
8. Riggs, V. and Parker, M., in Methods of Surface Analysis, Czanderna, A., Ed., Amsterdam: Elsevier, 1975. Translated under the title Melody analiza poverkhnosti, Moscow: Mir, 1979, p. 137.
9. Carlson, T.A., Photoelectron and Auger Spectroscopy, New York: Plenum, 1975. Translated under the title Fotoelektronnaya i ozhe-elektronnaya spektroskopiya, Leningrad: Mashinostroenie, 1981.
10. Carlson, T.A., Photoelectron and Auger Spectroscopy, New York: Plenum, 1975. Translated under the title Fotoelektronnaya i ozhe-elektronnaya spektroskopiya, Leningrad: Mashinostroenie, 1981.
11. Wertheim, G., in Electron and Ion Spectroscopy of Solids, Fiermans, L., Vennik, J., and Dekeyser, W., Eds., New York: Plenum, 1978, p. 195. Translated under the title Elektronnaya i ionnaya spektroskopiya tverdykh tel, Moscow: Mir, 1981, p. 195.
12. Wertheim, G., in Electron and Ion Spectroscopy of Solids, Fiermans, L., Vennik, J., and Dekeyser, W., Eds., New York: Plenum, 1978, p. 195. Translated under the title Elektronnaya i ionnaya spektroskopiya tverdykh tel, Moscow: Mir, 1981, p. 195.
13. Minachev, Kh.M., Antoshin, G.V., and Shpiro, E.S., Fotoelektronnaya spektroskopiya i ee primenenie v katalize (Photoelectron Spectroscopy and Its Application in Catalysis), Moscow: Nauka, 1981.
14. Nemoshkalenko, V.V. and Aleshin, V.G., Elektronnaya spektroskopiya kristallov (Electron Spectroscopy of Crystals), 2nd ed., Kiev: Naukova Dumka, 1983.
15. Nefedov, V.I. and Cherepin, V.T., Fizicheskie melody issledovaniya poverkhnosti tverdykh tel (Physical Methods of Studying Solid Surfaces), Moscow: Nauka, 1983.
16. Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, Briggs, D. and Seah, M., Eds., New York: Wiley, 1983. Translated under the title Analiz poverkhnosti metodami ozhe- i rentgenovskoi fotoelektronnoi spektroskopii, Moscow: Mir, 1987.
17. Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, Briggs, D. and Seah, M., Eds., New York: Wiley, 1983. Translated under the title Analiz poverkhnosti metodami ozhe- i rentgenovskoi fotoelektronnoi spektroskopii, Moscow: Mir, 1987.
18. Wagner, C.D., Riggs, W.M., Davis, L.E., et al., Handbook of X-ray Photoelectron Spectroscopy, Eden Prairie: Perkin-Elmer Corp., Phys. Electronics Division, 1979.
19. Nefedov, V.I., Rentgenoelektronnaya spektroskopiya khimicheskikh soedinenii (X-ray Photoelectron Spectroscopy of Chemical Compounds), Moscow: Khimiya, 1984.
20. Feldman, L.C. and Mayer, D., Fundamentals of Surface and Thin Film Analysis, New York: Elsevier, 1986. Translated under the title Osnovy analiza poverkhnosti i tonkikh plenok, Moscow: Mir, 1989.
21. Feldman, L.C. and Mayer, D., Fundamentals of Surface and Thin Film Analysis, New York: Elsevier, 1986. Translated under the title Osnovy analiza poverkhnosti i tonkikh plenok, Moscow: Mir, 1989.
22. Woodruff, D.P. and Delchar, T.A., Modern Techniques of Surface Science, Cambridge: Cambridge University Press, 1986. Translated under the title Sovremennye melody issledovaniya poverkhnosti, Moscow: Mir, 1989.
23. Woodruff, D.P. and Delchar, T.A., Modern Techniques of Surface Science, Cambridge: Cambridge University Press, 1986. Translated under the title Sovremennye melody issledovaniya poverkhnosti, Moscow: Mir, 1989.
24. Alov, N.V., in Osnovy analiticheskoi khimii (Basic Analytical Chemistry), vol. 2: Metody khimicheskogo analiza (Methods of Chemical Analysis), 2nd ed., Zolotov, Yu.A., Ed., Moscow: Vysshaya Shkola, 1999, p. 258.