An improved mean atomic number background correction for quantitative microanalysis

Microscopy and Microanalysis

Volumn 2, Issue 1, 1996, Pages 1-7

  Donovan, John J ^a   Tingle, Tracy N ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b STANFORD UNIVERSITY   (United States)

Author keywords

Atomic number; Background correction; Continuum; Microanalysis; Microprobe; Quantitative analysis

Indexed keywords

EID: 17144368499     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927696210013     Document Type: Article

References (10)

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