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Volumn 198-200, Issue PART 2, 1996, Pages 813-816
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Examination of (crystallized a-Ge:H) / a-SiNx:H multilayers which display photoluminescence
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CHEMICAL VAPOR DEPOSITION;
COMPUTER APPLICATIONS;
CRACK INITIATION;
CRYSTALLIZATION;
GLOW DISCHARGES;
MULTILAYERS;
PHOTOLUMINESCENCE;
RAMAN SCATTERING;
SEMICONDUCTOR QUANTUM WELLS;
X RAY DIFFRACTION;
GAS FLOWS;
GLANCING ANGLE X RAY DIFFRACTION;
LASER SCANNING;
QUANTUM CONFINEMENT;
AMORPHOUS MATERIALS;
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EID: 17044448644
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/0022-3093(96)00039-7 Document Type: Article |
Times cited : (4)
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References (10)
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