A depth profile XMCD study of Au/CoO/Co

Journal of Magnetism and Magnetic Materials

Volumn 242-245, Issue , 2002, Pages 958-960

  Alvarenga, A D ^a   Garcia, F ^b,c   Brewer, W D ^a,d   Gruyters, M ^e   Gierlings, M ^e   Reis, M S ^a   Panissod, P ^a,f   Sampaio, L C ^a   Guimaraes A P ^a  

^a CENTRO BRASILEIRO DE PESQUISAS FÍSICAS   (Brazil)

^b LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON   (Brazil)

^c CEA GRENOBLE   (France)

^d FREIE UNIVERSITÄT BERLIN   (Germany)

^e HAHN MEITNER INSTITUT   (Germany)

^f INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG   (France)

Author keywords

CoO Co; Depth profile; Dichroism circular magnetic; Exchange biasing; Magnetic moments; Thin films; X ray absorption

Indexed keywords

COBALT; INTERFACES (MATERIALS); MAGNETIC MOMENTS; SPUTTERING;

X-RAY MAGNETIC CIRCULAR DICHROISM (XMCD);

THIN FILMS;

EID: 17044445730     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(01)01311-7     Document Type: Article

References (15)