Highly reliable 7W operation of 644nm wavelength laser diode arrays with top-hat near field pattern

Conference Digest - IEEE International Semiconductor Laser Conference

Volumn , Issue , 2004, Pages 49-50

  Imanishi, Daisuke ^a   Sato, Yoshifumi ^a   Naganuma, Kaori ^a   Ito, Satoshi ^a   Hirata, Shoji ^a  

^a SONY CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CLADDING (COATING); HEAT LOSSES; HETEROJUNCTIONS; PRESSURE EFFECTS; REFRACTIVE INDEX; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS;

GRATING LIGHT VALVE (GLV); LASER DIODE ARRAYS; NEAR FIELD PATTERNS (NFP); SINGLE-QUANTUM-WELLS;

SEMICONDUCTOR LASERS;

EID: 17044426272     PISSN: 08999406     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)

1. th International Semiconductor Laser conference digest, p.131(2002)