A study of the degradation mechanism for carbon nanotubes in field emitter applications

Materials Science Forum

Volumn 475-479, Issue III, 2005, Pages 1771-1776

  Kim, D H ^a   Kim, T S ^a   Ahn, B K ^a   Shin, H Y ^a   Lee, D G ^b   Cho, H K ^c   Cho, Y R ^a  

^a Pusan National University   (South Korea)

^b Kumoh National Institute of Technology   (South Korea)

^c Dong A University   (South Korea)

Author keywords

Carbon nanotube; Degradation mechanism; Emission current; Field emission

Indexed keywords

CURRENT DENSITY; DEGRADATION; ELECTRIC CURRENTS; ELECTRIC FIELD MEASUREMENT; ELECTRIC POTENTIAL; FIELD EMISSION CATHODES; HIGH PRESSURE EFFECTS;

DEGRADATION MECHANISM; EMISSION CURRENT; FIELD EMISSION; SINGLE-WALL CARBON NANOTUBES (SWNT);

CARBON NANOTUBES;

EID: 17044423801     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-960-1.1771     Document Type: Conference Paper

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