Shape localization based on statistical method using extended local binary pattern

Proceedings - Third International Conference on Image and Graphics

Volumn , Issue , 2004, Pages 184-187

  Huang, Xiangsheng ^a   Li, Stan Z ^a   Wang, Yangsheng ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER VISION; CONSTRAINT THEORY; IMAGE ANALYSIS; PATTERN MATCHING; PATTERN RECOGNITION SYSTEMS; PROBLEM SOLVING; STATISTICAL MECHANICS; TEXTURES;

ACTIVE CONTOUR MODELS; EXTENDED LOCAL BINARY PATTERN (ELBP); FACE ANALYSIS; SHAPE LOCALIZATION;

FACE RECOGNITION;

EID: 17044398039     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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