Random deposition model with a constant capture length

Progress of Theoretical Physics

Volumn 113, Issue 1, 2005, Pages 15-28

  Politi, Paolo ^a,b,c   Saito, Yukio ^c  

^a ISTITUTO DEI SISTEMI COMPLESSI   (Italy)

^b INFM   (Italy)

^c KEIO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 17044385074     PISSN: 0033068X     EISSN: None     Source Type: Journal    
DOI: 10.1143/PTP.113.15     Document Type: Article

References (10)

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