Measurement of laser peening residual stresses

Materials Science and Technology

Volumn 21, Issue 1, 2005, Pages 3-9

  Hill, M R ^a   DeWald, A T ^a,b   Rankin, J E ^b   Lee, M J ^a  

^a University of California   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

Alloy 22; Contour method; Laser peening; Residual stress measurement; Slitting method

Indexed keywords

CONTOUR MEASUREMENT; CORROSION; LASER PULSES; SHOT PEENING; SLITTING; STRESS CORROSION CRACKING; SURFACE TREATMENT;

ALLOY 22; LASER PEENING; RESIDUAL STRESS MEASUREMENT; SLITTING METHOD;

RESIDUAL STRESSES;

EID: 17044375390     PISSN: 02670836     EISSN: None     Source Type: Journal    
DOI: 10.1179/174328405X14083     Document Type: Conference Paper

References (20)

1. G. S. Bodvarsson, W. Boyle, R. Patterson and D. Williams: J. Containm. Technol., 1999, 38, 3-24.
2. J. Farmer, S. Lu, T. Summers, D. McCright, A. Lingenfelter, F. Wang, J. Estill, L. Hackel, H.-L. Chen, G. Gordon, V. Pasupathi, P. Andersen, S. Tang and M. Herrera: in 'PVP vol. 408 transportation, storage, and. disposal of radioactive materials', (ed. R. S. Hafner), 71-81; 2000, New York, ASME.
3. B. P. Fairland, B. A. Wilcox, W. J. Gallagher and D. N. Williams: J. Appl. Phys., 1972, 43, 3893-3895.
4. P. Peyre, C. Braham, J. Ledion, L. Berthe and R. Fabbro: J. Mater. Eng. Perform., 2000, 9, 656-662.
5. W. Z. Zhuang and G. R. Halford: Int. J. Fatigue, 2001, 23, S31-S37.
6. P. Peyre, R. Fabbro, P. Merrien and H. P. Lieurade: Mater. Sci. Eng. A, 1996, A210, 102-113.
7. J. Farmer, D. MeCright, G. Gdowski, F. Wang, T. Summers, P. Bedrossian, J. Horn, T. Lian, J. Estill, A. Lingenfelter and W. Halsey: in 'PVP vol. 408 transportation, storage, and disposal of radioactive materials', (ed. R. S. Hafner), 53-70; 2000, New York, ASME.
8. M. B. Prime: Appl. Mech. Rev., 1999, 52, 75-96.
9. M. B. Prime: J. Eng. Mater. Technol., 2001, 123, 162-168.
10. J.-E. Masse and G. Barreau: Surf. Coat. Technol., 1995, 70, 231-234.
11. R. Fabbro, P. Peyre, L. Berthe and X. Scherpereel: J. Laser Applic., 1998, 10, 265-279.
12. R. Fabbro, J. Fournier, P. Ballard, D. Devaux and J. Virmont: J. Appl. Phys., 1990, 68, 775-784.
13. C. B. Dane, L. A. Hackel, J. Daly and J. Harrisson: Mater. Manuf. Process., 2000, 15, 81-96.
14. C. B. Dane, L. E. Zapata, W. A. Neuman, M. A. Norton and L. A. Hackel: IEEE J. Quantum Electron., 1995, 31, 148-163.
15. S. Vaidyanathan and I. Finnie: J. Basic Eng., 1971, 93, 242-246.
16. M. R. Hill and W. Y. Lin: J. Eng. Mater. Technol., 2002, 124, 185-191.
17. J. Lu (ed.): 'Handbook of measurement of residual stresses'; 1996, Littara, GA, Fairmont Press.
18. A. D. Krawitz and R. A. Winholtz: Mater. Sci. Eng. A, 1994, A185, 123-130.
19. T. Lorentzen and J. B. Ibsø: Mater. Sci. Eng. A, 1995, A197, 209-214.
20. M. B. Prime, D. J. Hughes and P. J. Webster: Proc. SEM Annu. Conf. on 'Experimental and applied mechanics', Portland, OR, USA, June 2001, 608-611.