Surface core-level shifts of Si(111)7 × 7: A critical evaluation of the Si 2p analysis

Journal of Electron Spectroscopy and Related Phenomena

Volumn 88-91, Issue , 1998, Pages 711-715

  Le Lay, G ^a,b   Cricenti, A ^c   Ottaviani, C ^c   Hakansson C ^c   Perfetti, P ^c   Prince, K C ^d  

^a CAMPUS DE LUMINY   (France)

^b AIX MARSEILLE UNIVERSITY   (France)

^c CNR   (Italy)

^d SINCROTRONE TRIESTE   (Italy)

Author keywords

Core level spectroscopy; Silicon; Surface reconstruction

Indexed keywords

EID: 17044366840     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(97)00205-3     Document Type: Article

References (11)

1. K. Takayanagi et al., J. Vac. Sci. Technol. A3 (1985) 1502.
2. G. Le Lay et al., Phys. Rev. B50 (1994) 14227.
3. C.J. Karlsson et al., Phys. Rev. B50 (1994) 5767.
4. J.J. Paggel et al., Phys. Rev. B50 (1994) 18686.
5. G. Le Lay and M. Fontaine, Phys. Rev. Lett. 71 (1994) 3740; G. Le Lay, V. Yu Aristov and M. Fontaine, J. Phys. (France) C9 (1994) 213.
6. G. Le Lay and M. Fontaine, Phys. Rev. Lett. 71 (1994) 3740; G. Le Lay, V. Yu Aristov and M. Fontaine, J. Phys. (France) C9 (1994) 213.
7. C. Quaresima et al, Nucl. Instr. and Meth. in Phys. Res. A364 (1995) 374.
8. K. Hricovini et al., Phys. Rev. Lett. 70 (1992) 1588.
9. J.E. Northrup, Phys. Rev. Lett. 57 (1986) 154.
10. J.A. Carlisle et al., Phys. Rev. Lett. 71 (1993) 2955.
11. D.A. Shirley, Phys. Rev. B50 (1972) 4709.