Electrical, optical and structural properties of copper aluminium diSelenide thin films

Solid State Phenomena

Volumn 55, Issue , 1997, Pages 226-229

  Joseph, C M ^a   Menon, C S ^a  

^a MAHATMA GANDHI UNIVERSITY   (India)

Author keywords

Activation Energy; Band Gap; Thin Films

Indexed keywords

ACTIVATION ENERGY; ANNEALING; COPPER COMPOUNDS; DEPOSITION; ELECTRIC CONDUCTIVITY MEASUREMENT; ENERGY GAP; EVAPORATION; GRAIN SIZE AND SHAPE; LIGHT TRANSMISSION; SEMICONDUCTING SELENIUM COMPOUNDS; VACUUM APPLICATIONS; X RAY CRYSTALLOGRAPHY;

COPPER ALUMINUM DISELENIDE; VACUUM FLASH EVAPORATION;

SEMICONDUCTING FILMS;

EID: 16944363401     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/ssp.55.226     Document Type: Article

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