Temperature dependent structural properties of PbMg1/3Nb 2/3O3thin films

Ferroelectrics

Volumn 288, Issue , 2003, Pages 277-285

  Lemee, N ^a   Bouyanfif, H ^a   Le Marrec, F ^a   Karkut, M G ^a   Dkhil, B ^b   Chevreul, J ^b   Kiat, J M ^b  

^a Universite de Picardie Jules Verne   (France)

^b LABORATOIRE STRUCTURES   (France)

Author keywords

Pulsed laser deposition; Relaxors; Thin films; X ray diffraction

Indexed keywords

CRYSTAL LATTICES; LEAD COMPOUNDS; PULSED LASER DEPOSITION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SINGLE CRYSTALS; SUBSTRATES; THERMAL EXPANSION; X RAY DIFFRACTION;

ASYMMETRIC ROCKING CURVES; RELAXORS; TETRAGONAL DISTORTION; X-RAY DIFFRACTION MEASUREMENTS;

THIN FILMS;

EID: 16844382651     PISSN: 00150193     EISSN: 15635112     Source Type: Conference Proceeding    
DOI: 10.1080/00150190390211332     Document Type: Conference Paper

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