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Volumn 71, Issue 1, 2005, Pages

Mass fractal characteristics of silica sonogels as determined by small-angle x-ray scattering and nitrogen adsorption

Author keywords

[No Author keywords available]

Indexed keywords

NITROGEN; SILICON DIOXIDE; TETRAETHOXYSILANE; WATER;

EID: 16844380020     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.014203     Document Type: Article
Times cited : (13)

References (11)
  • 7
    • 0003702492 scopus 로고
    • edited by O. Glatter and O. Kratky (Academic, London)
    • G. Porod, in Small Angle X-ray Scattering, edited by O. Glatter and O. Kratky (Academic, London, 1982).
    • (1982) Small Angle X-ray Scattering
    • Porod, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.