A novel measurement device for SAW chemical sensors with FT-IR spectro-microscopic analytical capability

Tamkang Journal of Science and Engineering

Volumn 8, Issue 1, 2005, Pages 63-66

  Hoang, Shi Hung ^a   Horng, Gor Don ^a   Chiang, Chen Yu ^a   Ko, Cheng Hao ^b   Lo, Yi Chung ^b   Chen, Ching Iue ^b   Chang, Chao Kang ^c  

^a YUAN ZE UNIVERSITY   (Taiwan)

^b NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

^c INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

Author keywords

Fourier transform Infrared (FT IR); Molecular Imprinted Polymer (MIP); Surface Acoustic Wave (SAW)

Indexed keywords

ACOUSTIC SURFACE WAVE DEVICES; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GEOMETRY; POLYMERS; SIGNAL PROCESSING; THIN FILMS;

DELAY-LINE AREA; MIP THIN FILMS; MOLECULAR IMPRINTED POLYMER (MIP); MOLECULAR SELECTIVITY;

CHEMICAL SENSORS;

EID: 16644369367     PISSN: 15606686     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)

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