-
1
-
-
0037989155
-
Intense surface photoemission: Space charge effects and self-acceleration
-
Gilton TL, Cowin JP, Kubiak GD, Hamza AV (1990) Intense surface photoemission: Space charge effects and self-acceleration. J Appl Phys 68:4802-4810
-
(1990)
J Appl Phys
, vol.68
, pp. 4802-4810
-
-
Gilton, T.L.1
Cowin, J.P.2
Kubiak, G.D.3
Hamza, A.V.4
-
2
-
-
0026152254
-
Historical perspective and current trends in emission microscopy, mirror electron microscopy, and low-energy electron microscopy
-
Griffith OH, Engel W (1991) Historical perspective and current trends in emission microscopy, mirror electron microscopy, and low-energy electron microscopy. Ultramicroscopy 36:1-28
-
(1991)
Ultramicroscopy
, vol.36
, pp. 1-28
-
-
Griffith, O.H.1
Engel, W.2
-
3
-
-
0018456094
-
Milliwatt-level 213 nm source based on a repetitively Q-switched, cw-pumped Nd:YAG laser
-
Jones MD, Massey GA (1979) Milliwatt-level 213 nm source based on a repetitively Q-switched, cw-pumped Nd:YAG laser. IEEE J Quant Electron 15:204-206
-
(1979)
IEEE J Quant Electron
, vol.15
, pp. 204-206
-
-
Jones, M.D.1
Massey, G.A.2
-
4
-
-
0020750745
-
Measurement of laser photoelectron image degradation at high current densities
-
Massey GA (1983) Measurement of laser photoelectron image degradation at high current densities. IEEE J Quant Electron 19:873-877
-
(1983)
IEEE J Quant Electron
, vol.19
, pp. 873-877
-
-
Massey, G.A.1
-
5
-
-
0019579230
-
Nonlinear photoemission for viewing guided or evanescent waves
-
Massey GA, Jones MD, Johnson JC (1981a) Nonlinear photoemission for viewing guided or evanescent waves. IEEE J Quant Electron 17:1035-1041
-
(1981)
IEEE J Quant Electron
, vol.17
, pp. 1035-1041
-
-
Massey, G.A.1
Jones, M.D.2
Johnson, J.C.3
-
6
-
-
0019577949
-
Space charge aberrations in the photoelectron microscope
-
Massey GA, Jones MD, Plummer BP (1981b) Space charge aberrations in the photoelectron microscope. J Appl Phys 52:3780-3786
-
(1981)
J Appl Phys
, vol.52
, pp. 3780-3786
-
-
Massey, G.A.1
Jones, M.D.2
Plummer, B.P.3
-
7
-
-
16444369692
-
Normal, Poisson, and related probability laws
-
New York: John Wiley & Sons, Chap. 6
-
Parzen E (1960) Normal, Poisson, and related probability laws. In: Modern Probability Theory and Its Applications. New York: John Wiley & Sons, Chap. 6, pp 251-257
-
(1960)
Modern Probability Theory and Its Applications
, pp. 251-257
-
-
Parzen, E.1
-
8
-
-
0026155289
-
Design and performance of a high-resolution photoelectron microscope
-
Rempfer GF, Skoczylas WP, Griffith OH (1991) Design and performance of a high-resolution photoelectron microscope. Ultramicroscopy 36:196-221
-
(1991)
Ultramicroscopy
, vol.36
, pp. 196-221
-
-
Rempfer, G.F.1
Skoczylas, W.P.2
Griffith, O.H.3
-
9
-
-
16444366147
-
Applications to the tube characteristic
-
Englewood Cliffs, NJ: Prentice-Hall, Chap. 8
-
van der Ziel A (1968) Applications to the tube characteristic. In: Solid State Physical Electronics, 2nd ed. Englewood Cliffs, NJ: Prentice-Hall, Chap. 8, pp 152-155
-
(1968)
Solid State Physical Electronics, 2nd Ed.
, pp. 152-155
-
-
Van Der Ziel, A.1
-
10
-
-
16444383938
-
The particle at a potential barrier or in a potential well
-
New York: McGraw-Hill, Chap. 8
-
White RL (1966) The particle at a potential barrier or in a potential well. In: Basic Quantum Mechanics. New York: McGraw-Hill, Chap. 8, pp 147-152
-
(1966)
Basic Quantum Mechanics
, pp. 147-152
-
-
White, R.L.1
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