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Journal of Applied Physics

Volumn 76, Issue 6, 1994, Pages 3656-3668

Precipitation and relaxation in strained Si1-yCy/Si heterostructures

(6) Strane, J W a Stein, H J b Lee, S R b Picraux, S T b Watanabe, J K c Mayer, J W d

a Cornell University ^* (United States)

b SANDIA NATIONAL LABORATORIES (United States)

c MOTOROLA INC (United States)

d ARIZONA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 16444376728 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.357429 Document Type: Article

Times cited : (132)

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