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Volumn 107, Issue 1-4, 2004, Pages 160-165
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Characterizing the non-stationary blinking of silicon nanocrystals
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Author keywords
Optical microscopy; Semiconductor nanocrystal
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Indexed keywords
DATA REDUCTION;
ELECTRON TUNNELING;
ELECTRONIC DENSITY OF STATES;
LIGHT EMISSION;
OPTICAL MICROSCOPY;
SILICON;
SPECTROSCOPY;
STATISTICAL OPTICS;
CONFOCAL MICROSCOPY;
OPTICAL EXCITATION;
NANOSTRUCTURED MATERIALS;
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EID: 1642634122
PISSN: 00222313
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jlumin.2003.12.040 Document Type: Conference Paper |
Times cited : (18)
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References (14)
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