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Volumn 107, Issue 1-4, 2004, Pages 160-165

Characterizing the non-stationary blinking of silicon nanocrystals

Author keywords

Optical microscopy; Semiconductor nanocrystal

Indexed keywords

DATA REDUCTION; ELECTRON TUNNELING; ELECTRONIC DENSITY OF STATES; LIGHT EMISSION; OPTICAL MICROSCOPY; SILICON; SPECTROSCOPY; STATISTICAL OPTICS;

EID: 1642634122     PISSN: 00222313     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jlumin.2003.12.040     Document Type: Conference Paper
Times cited : (18)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.