Intrinsic excess noise in a transition edge sensor

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 520, Issue 1-3, 2004, Pages 325-328

  Seidel, G M ^a   Beloborodov, I S ^b,c  

^a BROWN UNIVERSITY   (United States)

^b LUCENT TECHNOLOGIES   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Noise; Superconductivity

Indexed keywords

INTRINSIC TEMPERATURE FLUCTUATIONS; TRANSITION EDGE SENSORS (TES);

ELECTRIC CONDUCTIVITY; ELECTRIC FIELD EFFECTS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; SCATTERING; SPURIOUS SIGNAL NOISE; SUPERCONDUCTIVITY;

SENSORS;

EID: 1642619013     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2003.11.258     Document Type: Conference Paper

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