Measurement of the attributes of complex tonal components commonly found in product sound

Noise Control Engineering Journal

Volumn 51, Issue 4, 2003, Pages 195-209

  Hastings, Aaron ^a   Lee, Kyoung Hoon ^a   Davies, Patricia ^a   Surprenant, Aimée M ^b  

^a PURDUE UNIVERSITY   (United States)

^b PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC NOISE; BANDWIDTH; FREQUENCIES; MATHEMATICAL MODELS; SYSTEMS ANALYSIS;

TONALNESS; TONE-TO-NOISE RATIO;

ACOUSTIC NOISE MEASUREMENT;

EID: 1642603523     PISSN: 07362501     EISSN: None     Source Type: Journal    
DOI: 10.3397/1.2839715     Document Type: Conference Paper

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