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Volumn 29, Issue 9-10, 2000, Pages 2143-2155

Breaking alias chains in fractional factorials

Author keywords

Alias chains, sequential experiments; Fractional designs

Indexed keywords


EID: 1642582122     PISSN: 03610926     EISSN: None     Source Type: Journal    
DOI: 10.1080/03610920008832600     Document Type: Article
Times cited : (10)

References (7)
  • 1
    • 0342374860 scopus 로고    scopus 로고
    • Using fewer wafers to resolve confounding in screening experiments
    • edited by Veronica Czitrom and Pat Spagon, ASA-SIAM Series on Statistics and Applied Probability, chapter 17
    • Barnett, Joel, Veronica Czitrom, Peter W.M. John and Ramon V. Leon, (1997). Using fewer wafers to resolve confounding in screening experiments, Statistical Case Studies for Industrial Process Development, edited by Veronica Czitrom and Pat Spagon, ASA-SIAM Series on Statistics and Applied Probability, chapter 17, 235-250.
    • (1997) Statistical Case Studies for Industrial Process Development , pp. 235-250
    • Barnett, J.1    Czitrom, V.2    John, P.W.M.3    Leon, R.V.4
  • 2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.