SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium - Proceedings

Volumn 762, Issue , 2003, Pages 321-326

Electronic Properties of Microcrystalline Silicon investigated by Photoluminescence Spectroscopy on Films and Devices

(3) Carius, R a Merdzhanova, T a Finger, F a

a FORSCHUNGSZENTRUM JÜLICH (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; ELECTRONIC PROPERTIES; INFRARED SPECTROSCOPY; PHOTOLUMINESCENCE; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; RAMAN SCATTERING; SOLAR CELLS; STRAIN; X RAY DIFFRACTION;

MICROCRYSTALLINE SILICON; PHOTOLUMINESCENCE SPECTROSCOPY;

SILICON;

EID: 1642581709 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: 10.1557/proc-762-a4.2 Document Type: Conference Paper

Times cited : (6)

References (11)

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2
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- Klein, S.¹ Finger, F.² Carius, R.³ Rech, B.⁴ Houben, L.⁵ Luysberg, M.⁶ Stutzmann, M.⁷

3
- 0038212800
- P. K. Bhat, G. Diprose, T. M. Searle, I. G. Austin, P. G. LeComber, W. E. Spear, Physica 117&118B, 917 (1983); P. K. Bhat, I. G. Austin, T. M. Searle, J. Non-Crystal. Solids, 59&60, 381 (1983)
- (1983) Spear Physica , vol.117-118 B , pp. 917
- Bhat, P.K.¹ Diprose, G.² Searle, T.M.³ Austin, I.G.⁴ LeComber, P.G.⁵ Spear, W.E.⁶

4
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- Bhat, P.K.¹ Austin, I.G.² Searle, T.M.³

5
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- San Francisco, unpublished
- R. Carius, Mat. Res. Soc. Meeting, San Francisco, (2000) unpublished
- (2000) Mat. Res. Soc. Meeting
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7
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9
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