New simple ESPI configurations for deformation studies on large structures based on diffused reference beam

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2861, Issue , 1996, Pages 257-263

  Santhanakrishnan, T ^a   Krishna Mohan, N ^b   Sirohi, R S ^b  

^a ANNA UNIVERSITY   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

Deformation measurement; Diffuse reference beam; Electronic Speckle Pattern Interferometry (ESPI); Thermal deflection; TV holography

Indexed keywords

DEFORMATION; HOLOGRAPHIC INTERFEROMETRY; LASER INTERFEROMETRY;

DEFORMATION MEASUREMENTS; ELECTRONIC SPECKLE PATTERN INTERFEROMETRY; REFERENCE BEAMS; THERMAL DEFLECTIONS; TV HOLOGRAPHY;

SPECKLE;

EID: 1642553642     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.245174     Document Type: Conference Paper

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