Electronic Conduction and Breakdown in Liquid Helium and Liquid Neon

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 10, Issue 6, 2003, Pages 1012-1021

  Schmidt, Werner F ^a   Illenberger, Eugen ^a   Khrapak, Alexey G ^b   Sakai, Yosuke ^c   Yoshino, Katsumi ^d  

^a FREIE UNIVERSITÄT BERLIN   (Germany)

^b RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

^c HOKKAIDO UNIVERSITY   (Japan)

^d OSAKA UNIVERSITY   (Japan)

Author keywords

Breakdown; Delocalized electrons; Electron multiplication; Heat of vaporization; Liquid helium; Liquid neon; Radiation; Townsend process

Indexed keywords

CATHODES; CHARGE CARRIERS; COSMIC RAYS; ELECTRIC BREAKDOWN; ELECTRIC CONDUCTANCE; ELECTRIC FIELD EFFECTS; ELECTRODES; ELECTRONIC PROPERTIES; ELECTROSTRICTION; IONIZATION; MELTING; NEON; RADIATION; VAPORIZATION;

BREAKDOWN; DELOCALIZED ELECTRONS; ELECTRON MULTIPLICATION; HEAT OF VAPORIZATION; LIQUID HELIUM; LIQUID NEON; TOWNSEND PROCESSES;

HELIUM;

EID: 1642526539     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2003.1255779     Document Type: Conference Paper

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