Using X-band Weather Radar Measurements to Monitor the Integrity of Digital Elevation Models for Synthetic Vision Systems

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5081, Issue , 2003, Pages 66-76

  Young, Steve ^a   Uijt de Haag, Maarten ^b   Sayre, Jonathon ^b  

^a NASA LANGLEY RESEARCH CENTER   (United States)

^b OHIO UNIVERSITY   (United States)

Author keywords

Digital elevation models; Feature detection; Integrity; Radar; Synthetic vision systems

Indexed keywords

DATA PROCESSING INTEGRITY; DIGITAL ELEVATION MODELS (DEM); HAZARDOUS MISLEADING INFORMATION (HMI); SYNTHETIC VISION SYSTEMS (SVS);

AIRCRAFT LANDING SYSTEMS; AIRPORT RUNWAYS; ALARM SYSTEMS; ALGORITHMS; ANEROID ALTIMETERS; DISPLAY DEVICES; FEATURE EXTRACTION; IMAGE SENSORS; REAL TIME SYSTEMS; STATISTICAL METHODS; VISION;

METEOROLOGICAL RADAR;

EID: 1642515755     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.489000     Document Type: Conference Paper

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