Effect of Alignment on Transport Properties of Carbon Nanotube/Metallic Junctions

Materials Research Society Symposium - Proceedings

Volumn 772, Issue , 2003, Pages 209-214

  Wincheski, Buzz ^a   Namkung, Min ^a   Smits, Jan ^b   Williams, Phillip ^c   Harvey, Robert ^d  

^a NASA LANGLEY RESEARCH CENTER   (United States)

^b Lockheed Martin Space Operation   (United States)

^c NATIONAL RESEARCH COUNCIL   (United States)

^d CHRISTOPHER NEWPORT UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; ELECTRODES; ELECTRON BEAM LITHOGRAPHY; MAGNETIC FIELD EFFECTS; NONDESTRUCTIVE EXAMINATION; SEMICONDUCTOR JUNCTIONS; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; TRANSPORT PROPERTIES;

JUNCTION RESISTANCE; METALLIC JUNCTIONS; SCANNING PROBE MICROSCOPY;

CARBON NANOTUBES;

EID: 1642500263     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-772-m9.2     Document Type: Conference Paper

References (8)

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