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Volumn 182, Issue 1, 2000, Pages 255-260

TDS applied to investigate the hydrogen and silane desorption from porous silicon

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ELECTROCHEMISTRY; ETCHING; HEATING; HYDROGEN; MASS SPECTROMETRY; SILANES; SPECTROSCOPIC ANALYSIS; TEMPERATURE PROGRAMMED DESORPTION;

EID: 1642435480     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200011)182:1<255::AID-PSSA255>3.0.CO;2-S     Document Type: Article
Times cited : (16)

References (20)
  • 2
    • 0004140205 scopus 로고    scopus 로고
    • EMIS Datareview Series, No. 18, INSPEC, London
    • in: Properties of Porous Silicon, Ed. L. CANHAM, EMIS Datareview Series, No. 18, INSPEC, London 1997 (p. 343-399).
    • (1997) Properties of Porous Silicon , pp. 343-399
    • Canham, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.