Long-term Reliability of High Performance Waveguide Integrated Photodetectors for 40GHz Applications and Beyond

Conference on Optical Fiber Communication, Technical Digest Series

Volumn 86, Issue , 2003, Pages 758-760

  Tornow, S ^a   Trommer, D ^a   Umbach, A ^a   Schumann, D ^a  

^a U2T PHOTONICS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; DIELECTRIC MATERIALS; DRY ETCHING; FREQUENCY RESPONSE; MECHANICAL TESTING; METALLORGANIC VAPOR PHASE EPITAXY; OPTICAL COMMUNICATION; PHOTODIODES; POLARIZATION; RELIABILITY; TELECOMMUNICATION SYSTEMS; VIBRATIONS (MECHANICAL); WAVEGUIDES; OPTICAL FIBER FABRICATION; OPTICAL FIBERS; OPTICAL WAVEGUIDES; PHOTODETECTORS; PHOTONS; SEMICONDUCTOR DEVICE TESTING; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; TESTING; WAVEGUIDE COMPONENTS;

MOISTURE RESISTANCES; TEMPERATURE CYCLING; WAVEGUIDE INTEGRATED PHOTODETECTORS;

PHOTODETECTORS; OPTICAL FIBER COMMUNICATION;

ACCELERATED AGING; OPTICAL DEVICE FABRICATION; PIN DIODE; PIN PHOTODIODE; SEMICONDUCTOR DEVICE MEASUREMENTS;

EID: 1642423893     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

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