Print Quality Test Page

International Conference on Digital Printing Technologies

Volumn , Issue , 2003, Pages 575-580

  Jang, Woonyoung ^a   Chen, Mu Chih ^a   Allebach, Jan P ^a   Chiu, George T C ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PRINT QUALITY (PQ); PRINT QUALITY TEST PAGES;

COLOR; COSTS; CUSTOMER SATISFACTION; DEFECTS; IMAGE QUALITY; IMAGING SYSTEMS; PHOTOGRAPHY; PRINTERS (COMPUTER);

PRINTING;

EID: 1642415966     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)

1. Woonyoung Jang and Jan P. Allebach, Simulation of Print quality defects, Proc. NIP18, pg. 543. (2002)
2. Ralph Levien, Highly Sensitive Register Mark based on Moire Patterns, SPIE Color hard copy and graphic arts II, pg. 423. (1993)