Edge-based finite-element analysis of the field patterns in V-shaped microshield line

Microwave and Optical Technology Letters

Volumn 41, Issue 1, 2004, Pages 43-47

  Lu, Mal ^a   Leonard, Paul J ^a  

^a University of Bath   (United Kingdom)

Author keywords

Edge based finite element method; Field pattern; V shaped microshield line

Indexed keywords

CONFORMAL MAPPING; DIELECTRIC MATERIALS; ELECTRIC IMPEDANCE; FINITE ELEMENT METHOD; LAPLACE TRANSFORMS; MAGNETIC FIELDS; METHOD OF MOMENTS; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

EDGE-BASED FINITE-ELEMENT METHODS; FIELD PATTERNS; V-SHAPED MICROSHIELD LINES;

ELECTRIC LINES;

EID: 1642400156     PISSN: 08952477     EISSN: None     Source Type: Journal    
DOI: 10.1002/mop.20041     Document Type: Article

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