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Volumn 84, Issue 8, 2004, Pages 1371-1373

Measurements of composition and electronic structure in an operating light-emitting diode using analytical electron microscopy

(4) Bosman, M a Sitarz, M b Sikorski, A Z a Keast, V J a

a UNIVERSITY OF SYDNEY (Australia)

b Inst Francais de Mecanique Avancee (France)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC STRUCTURE; ENCAPSULATION; ENERGY DISPERSIVE SPECTROSCOPY; HETEROJUNCTIONS; LIGHT EMISSION; MICROSTRUCTURE; MORPHOLOGY; QUANTUM EFFICIENCY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR QUANTUM WELLS; TRANSMISSION ELECTRON MICROSCOPY;

BAND ENERGY LEVELS; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM);

LIGHT EMITTING DIODES;

EID: 1642399772 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1649798 Document Type: Article

Times cited : (3)

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