Thin-Film Enhanced Goos-Hänchen Shift in Total Internal Reflection

Chinese Physics Letters

Volumn 21, Issue 3, 2004, Pages 485-488

  Li, Chun Fang ^a,b   Yang, Xiao Yan ^b  

^a XI AN INSTITUTE OF OPTICS AND PRECISION MECHANICS   (China)

^b SHANGHAI UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACES (MATERIALS); THIN FILMS;

BEAM WIDTHS; DECAYING FIELDS; DIELECTRIC INTERFACE; DIELECTRIC THIN FILMS; LIGHT BEAM; OPTICALLY THIN MEDIA; PROPAGATING FIELD; PROPERTY; THIN-FILMS; TOTAL INTERNAL REFLECTIONS;

REFRACTIVE INDEX;

EID: 1642387085     PISSN: 0256307X     EISSN: None     Source Type: Journal    
DOI: 10.1088/0256-307X/21/3/019     Document Type: Article

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