Determination of the capacitance of nm scale Josephson junctions

Journal of Applied Physics

Volumn 95, Issue 5, 2004, Pages 2607-2613

  Deppe, Frank ^a,b,c   Saito, Shiro ^a,c   Tanaka, Hirotaka ^a,c   Takayanagi, Hideaki ^a,c  

^a Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CURRENT VOLTAGE CHARACTERISTICS; ERROR ANALYSIS; MICROWAVES; PARAMETER ESTIMATION; QUANTUM ELECTRONICS; QUANTUM INTERFERENCE DEVICES; RESONANCE; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPY;

QUANTUM COMPUTERS; QUBITS;

JOSEPHSON JUNCTION DEVICES;

EID: 1642373129     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1645673     Document Type: Article

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