Optical properties of SiO2 determined by reflection electron energy loss spectroscopy

Catalysis Today

Volumn 89, Issue 3, 2004, Pages 303-306

  Bekhti, W ^a   Ghamnia, M ^a  

^a UNIVERSITY OF ORAN   (Algeria)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; DATA REDUCTION; DIELECTRIC MATERIALS; ENERGY TRANSFER; FUNCTIONS; MATHEMATICAL TRANSFORMATIONS; REFLECTION; SCATTERING; SPECTROSCOPIC ANALYSIS; THIN FILMS; ULTRAHIGH VACUUM;

DIELECTRIC FUNCTIONS; REFLECTION ELECTRON ENERGY LOSS SPECTRA (REELS);

SILICA;

EID: 1642362925     PISSN: 09205861     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cattod.2003.12.005     Document Type: Conference Paper

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