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Volumn 20, Issue 2, 2004, Pages 167-184

Experimental 'Reliability Growth' or 'Reliability Verification' Related with the Amount of Innovation in a New Car Model

Author keywords

Durability; Reliability; Reliability growth; Reliability testing; Reliability verification

Indexed keywords

AUTOMOBILE ENGINES; AUTOMOBILE TESTING; CUSTOMER SATISFACTION; DURABILITY; FAILURE ANALYSIS; MODEL AUTOMOBILES; PRODUCT DEVELOPMENT; RELIABILITY;

EID: 1642361264     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/qre.626     Document Type: Article
Times cited : (7)

References (4)
  • 1
    • 84937650085 scopus 로고
    • Learning curve approach to reliability monitoring
    • Duane JT. Learning curve approach to reliability monitoring. IEEE Transactions on Aerospace 1964; 2:563-566.
    • (1964) IEEE Transactions on Aerospace , vol.2 , pp. 563-566
    • Duane, J.T.1
  • 2
    • 1642415578 scopus 로고
    • Reliability growth management
    • U.S. Army Communications Research and Development Command, Fort Monmouth, NJ 07703, U.S.A., 13 February
    • U.S. Army. Reliability growth management. Military Handbook MIL-HDBK-189. U.S. Army Communications Research and Development Command, Fort Monmouth, NJ 07703, U.S.A., 13 February 1981.
    • (1981) Military Handbook MIL-HDBK-189
  • 3
    • 84964415981 scopus 로고
    • Gradual improvement of the vehicle reliability up to the target value
    • Florence, 16-18 March 1994. Associazione Tecnica dell' Automobile: Torino, Italy
    • Fantacchiotti M, Vianello M. Gradual improvement of the vehicle reliability up to the target value. ATA 4th International Conference, Florence, 16-18 March 1994. Associazione Tecnica dell' Automobile: Torino, Italy, 1994.
    • (1994) ATA 4th International Conference
    • Fantacchiotti, M.1    Vianello, M.2
  • 4
    • 1642365379 scopus 로고    scopus 로고
    • Reliability growth test planning and management reliability
    • Crow LH. Reliability growth test planning and management reliability. Reliability EDGE 2002; 3:1, 7-9.
    • (2002) Reliability EDGE , vol.3 , Issue.1 , pp. 7-9
    • Crow, L.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.