Peculiarity and defect structure of the natural and synthetic zeolite mordenite: A single-crystal X-ray study

American Mineralogist

Volumn 89, Issue 2-3, 2004, Pages 421-431

  Simoncic, Petra ^a   Armbruster, Thomas ^a  

^a UNIVERSITY OF BERN   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; DEFECTS; PLATES (STRUCTURAL COMPONENTS); SILICON; SINGLE CRYSTALS; SYNCHROTRON RADIATION; SYNCHROTRONS; X RAY TUBES; X RAYS; ZEOLITES;

DIFFERENCE-FOURIER MAP; DIFFUSE SCATTERING; EXTRA-FRAMEWORK CATIONS; FOUR-MEMBERED RINGS; FRAMEWORK STRUCTURES; SINGLE CRYSTAL X-RAY DATA; SIX-MEMBERED RINGS; SYNTHETIC ZEOLITES;

X RAY DETECTORS;

CRYSTAL STRUCTURE; DEFECT; MORDENITE; X-RAY DIFFRACTION; ZEOLITE;

EID: 1642351058     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am-2004-2-323     Document Type: Article

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