S-Parameter Measurements for Determination of the Impedance of IMPATT Diodes in Dependency on the Current Density

SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference Proceedings

Volumn , Issue , 2003, Pages 1075-1080

  Schoellhorn, Claus J ^a   Morschbach, Michael ^a   Zhao, Weiwei ^b   Kasper, Erich ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

^b ROBERT BOSCH GMBH   (Germany)

Author keywords

IMPATT diodes; Negative impedance; Reflection coefficient; Scattering parameter

Indexed keywords

NEGATIVE IMPEDENCE; REFLECTION COEFFICIENTS;

COMPUTATIONAL METHODS; CURRENT DENSITY; ELECTRIC IMPEDANCE; METALLIZING; MICROWAVE DEVICES; PERMITTIVITY; RESONATORS; SCATTERING PARAMETERS; SILICON WAFERS; WAVEGUIDES;

IMPATT DIODES;

EID: 1642347972     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

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