Surface modification of polymers by ion-assisted reaction

Thin Solid Films

Volumn 445, Issue 2, 2003, Pages 332-341

  Cho, J S ^a   Han, S ^a   Kim, K H ^a   Beag, Y W ^a   Koh, S K ^a  

^a P & I Corporation   (South Korea)

Author keywords

Adhesion; Functional groups; Surface modification; Wettability

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; CURRENT DENSITY; INTERFACIAL ENERGY; ION BEAMS; PHYSICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS; SURFACE TREATMENT; ULTRASONICS; WETTING; X RAY PHOTOELECTRON SPECTROSCOPY;

FUNCTIONAL GROUPS; WETTABILITY;

POLYMERS;

EID: 1642338678     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)01176-3     Document Type: Conference Paper

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