Dynamic hysteresis dispersion scaling of ferroelectric Nd-substituted Bi4Ti3O12 thin films

Journal of Physics Condensed Matter

Volumn 16, Issue 8, 2004, Pages 1189-1195

  Liu, J M ^a,b   Pan, B ^a,b   Yu, H ^a,b   Zhang, S T ^a,b  

^a NANJING UNIVERSITY   (China)

^b INTERNATIONAL CENTRE FOR MATERIALS PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DISPERSION SCALING; HYSTERESIS DISPERSION;

BISMUTH COMPOUNDS; DISPERSIONS; EXCIMER LASERS; FATIGUE OF MATERIALS; FERROELECTRIC MATERIALS; HYSTERESIS; NEODYMIUM; NUCLEATION; PARAMETER ESTIMATION; POLARIZATION; RANDOM ACCESS STORAGE; TIME DOMAIN ANALYSIS;

THIN FILMS;

EID: 1642330804     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/16/8/005     Document Type: Article

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