Evaluation of practical sensitivity and useful ion yield for uranium detection by secondary ion mass spectrometry

Journal of Analytical Atomic Spectrometry

Volumn 19, Issue 2, 2004, Pages 203-208

  Tamborini, G ^a   Donohue, D L ^b   Rudenauer F G ^b   Betti, M ^a  

^a JOINT RESEARCH CENTRE   (Italy)

^b INTERNATIONAL ATOMIC ENERGY AGENCY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

HEAVY IONS; ION BOMBARDMENT; ION IMPLANTATION; ISOTOPES; PARTICLE SIZE ANALYSIS; QUALITY CONTROL; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SPUTTERING; URANIUM DIOXIDE;

HARMONIZATION; URANIUM DETECTION;

URANIUM;

EID: 1642309765     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/b311019b     Document Type: Article

References (20)

1. D. L. Donohue, Anal. Chem., 2002, 1, 28A-35A.
2. G. Tamborini, M. Betti, V. Forcina, T. Hicrnaut and L. Koch, Spectrochim. Acta. Part B, 1998, 53(9), 1289-1302.
3. G. Tamborini and M. Betti, Mikrochim. Acta, 2000, 132, 411-417.
4. D. S. Simons, G. Gillen, C. J. Zeissler, R. H. Fleming and P. J. McNitt, Secondary Ion Mass Spectroinetry SIMS XI, eds. G. Gillen, R. Lareau, J. Bennet and F. Stevie, John Wiley & Sons, New York, 1998, pp. 59-62.
5. S. Lehto, Development of a SIMS Method for Isotopic Analysis of Uranium Containing Particles, Report on Task FIN A 1318 of the Finnish Support Procramme to IAEA Safeguards, STUK-YTOTR 188, 2002.
6. F. G. Rüdenauer, Y. Kuno, P. M. Hedberg, S. Vogt, M. Kohl and F. Pilchmayer, Proceedings of the 42nd INMM Annual Meeting, Indian Wells, California, USA, 2001.
7. S. Sakurai, Proceedings of the 42nd INMM Annual Meetine, Indian Wells, California, USA, 2001.
8. M. Betti, G. Tamborini and L. Koch, Anal. Chem., 1999, 71, 2616-2622.
9. M. Betti, Mass Spectrometric Techniques Applied for the Determination of Radionuclide Traces, Proceedings of the International Workshop on the Status of Measurements Techniques for the Identification of Nuclear Signatures, EUR 17312 EN, CEC Joint Research Centre, Ispra, Italy, 1997, p. 125.
10. J. N. Cooley, E. Kuhn and D. L. Donohue, Current Status of Environmental Sampling for IAEA Safeguards, Proceedings of the 19th annual ESARDA Symposium on Safeguards and Nuclear Material Management, EUR 17665 EN, CEC Joint Research Centre, Ispra, Italy, 1997, p. 125.
11. G. Tamborini, PhD Thesis, University of Paris-Sud, Orsay, France, 1998.
12. F. G. Rüdenauer, M. Riedel, H. E. Beske, H. Duesterhoeft, M. Gericke, J. Giber, H. Mai, H. Holzbrecher, C. E. Richter, M. Rieth, W. Steiger, G. Stingeder, A. Solyom and M. Trapp, Anal. Chem., 1985, 57, 1636-1643.
13. A. Benninghoven, F. G. Rüdenauer and H. W. Werner, Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications, and Trends, John Wiley & Sons, New York, 1987.
14. R. G. Wilson, F. A. Stevie and C. W. Magee, Secondary Ion Afass Spectrometry: A Practical Handbook for Depth Profiling and Bulk Impurity Analysis, John Wiley & Sons, New York, 1989.
15. F. G. Rüdenauer, Sensitivity Round Robin, Final Results, ITU and IAEA/SAL, SAL-IR 03/10, 2002.
16. N. Erdmann, M. Betti, O. Stetzer, G. Tamborini, J. V. Kratz, N. Trautmann and J. van Geel, Spectrochim. Acta, Part B, 2000, 55, 1565-1575.
17. D. L. Donohue and M. Ryjinski, Results of Particle Recovery Test, "Consultants Group Meeting on Particle Analysis for Safeguards Samples", IAEA, Vienna, 2001.
18. D. S. Simons, NIST, USA, 2003, personal communicalion.
19. J. D. Brown, W. H. Robinson, F. R. Shepherd and S. Dzoiba, Secondary Ion Mass Spcctroinetry SIMS IV, eds. A. Benninghoven, J. Okano, R. Shimizu and H. W. Werner, Springer-Verlag, Berlin,1984, pp. 296-298.
20. IMS 6f/IMS 1270 Users Guide, Ref. No. 45 402 615, Courbevoie, France, 1996.