Direct measurement of trapped and free charge distributions in semiconductors

Applied Physics Letters

Volumn 84, Issue 8, 2004, Pages 1308-1310

  Holé, Stéphane ^a   Lewiner, Jacques ^b  

^a SORBONNE UNIVERSITÉ   (France)

^b Lab d'Elec Gen   (France)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; ELECTRIC POTENTIAL; ELECTRIC SPACE CHARGE; ELECTRODES; ELECTRON MOBILITY; ELECTROSTRICTION; INTERFACES (MATERIALS); LASER PULSES; MATHEMATICAL MODELS; PERMITTIVITY; SILICON NITRIDE; SOLID STATE LASERS;

FREE CHARGE DISTRIBUTIONS; PRESSURE WAVE EXCITATION;

SEMICONDUCTOR MATERIALS;

EID: 1642303116     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1649813     Document Type: Article

References (8)

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